Expert Open Course | Rui Zhao: In-Vehicle SerDes Chip Test Technology and Ecosystem Construction
With the rapid development of science and technology, intelligent connected vehicles (ICVs) have become a global focus. To help users gain a deeper understanding of the cutting-edge trends and future prospects in the ICV field, China Automotive Technology & Research Center (CATARC) (Shenzhen) has launched the "Expert Perspective | Online Open Course" series, focusing on intelligence, connectivity, chips, and new services. This series will invite industry experts to share their professional insights and vivid explanations on core technologies, application scenarios, and development prospects, and to discuss the bright future of technological development with users. Today, we are pleased to invite Rui Zhao, the Platform Director of the Testing Business Department at CATARC Chip (Shenzhen) Technology Co., Ltd., to interpret the testing technology and ecosystem construction of automotive SerDes chips.
01 Research Background
As the intelligence and connectivity of vehicles continue to advance, automotive electronic control systems are becoming increasingly complex, and the requirements for automotive chips are also rising. The increasing level of vehicle intelligence has accelerated the application of SerDes chips in vehicles and raised the requirements for testing and verification of these chips.
02 Key Testing Technologies for SerDes Chips
Introduction to SerDes chips:
1. It is short name for Serializer/Deserializer.
2. It is a mainstream time-division multiplexing (TDM) and point-to-point (P2P) serial communication technology.
Key points of PMA testing:
1. The test host computer configures the node to be tested to work in test mode.
2. The node to be tested continuously sends signals in the corresponding test mode.
3. The oscilloscope is used to measure the electrical specifications of the signals.
Key points of PCS testing:
1. The test system configures the node to be tested to work in the corresponding service mode.
2. The test system queries the node status through the register.
3. The test system queries and detects the content of the protocol frames received by the node.
4. The test system collects statistics on the execution of test cases.
Key points of image service testing:
1. The test system configures the node to be tested to work in the corresponding service mode.
2. The test system checks whether the node is successfully connected.
3. The test system generates the corresponding test image data and sends it to the forward node.
4. The test system receives the image data from the reverse node through the integrated adapter board.
5. The test system compares whether the binary data of the images received and sent is consistent.
6. The test system collects statistics on the execution of test cases.
03 Ecosystem Construction Progress
Under the China Automotive Chip Standard Testing and Certification Alliance, the Automotive Chip HSMT Working Group has been established as a permanent working group of the alliance. The establishment of the Automotive Chip HSMT Working Group can effectively promote the research of testing technologies, support the verification and improvement of standards, achieve interconnection between products from multiple vendors, and promote the construction of the HSMT industry application ecosystem, thereby facilitating the selection and application of products by automotive manufacturers and tier-1 suppliers.
Currently, the group has more than 30 members, including original equipment manufacturers (OEMs), tier-1 suppliers, chip vendors, instrument and meter vendors, and connector and cable vendors. The HSMT industry ecosystem is thriving.